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Power-Aware Testing and Test Strategies for Low Power Devices
Patrick Girard , Nicola Nicolici , Xiaoqing Wen , Xiaoqing Wen
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today...

Editeur : Springer
Parution : 2010-03-11

ePub

105,49 €